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GaP Substrates (111)
GaP wafer undoped (111) 2" diaX 0.45mm 2sp,R> 7 x10^7 ohm.cm,Semi-Insulating
- Size
- 2" diameter(+/_0.15mm) x 0.45mm(+/_ 0.05mm)
- Resistivity
- >7 x10^7 ohm.cm
- carrier concentration
- 9 x10^8 cm^-3
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Flats
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SEMI: PF:<110> SF:<112>
- Polished
- two sides polished
- Surface finish (RMS or Ra)
- < 8A
- Typical Physical Properties
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Crystal Structure |
Cubic. a = 5.4505 Å |
Growth Method |
CZ (LEC) |
Density |
4.13 g/cm3 |
Melt Point |
1480 oC |
Thermal Expansion |
5.3 x 10-6 / oC |
Dopant |
S doped |
undoped |
Crystal growth axis |
<111> or <100> |
<100> or <111> |
Conducting Type |
N |
N |
Carrier Concentration |
2 ~ 8 x 1017 /cm3 |
4 ~ 6 x 1016 /cm3 |
Resistivity |
~ 0.03 ohm-cm |
~ 0.3 ohm-cm |
EPD |
< 3 x 105 |
< 3 x 105 |
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Working days : Monday to Saturday
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