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4" SiC-3C N doped Epi Film as CMP on both sides of Silicon Wafer after epitaxy growth,3.3 micron Thick,-SiC-3CP-4-03

4" SiC-3C N doped Epi Film as CMP on both sides of Silicon Wafer after epitaxy growth,3.3 micron Thick,-SiC-3CP-4-03

기본 정보
Product Name 4" SiC-3C N doped Epi Film as CMP on both sides of Silicon Wafer after epitaxy growth,3.3 micron Thick,-SiC-3CP-4-03
Sale Price Call for Price
Product Code SiC-3CP-4-03-US
Quantity 수량증가수량감소
상품 옵션
 
  •  Specifications
  • Film
  • SiC Epi film with 3C structure grown by PECVD   Thickness: 3300 nm +/- 10% (can be grown up to 20 micron th;
     the price would be increased with the requested film thickness)
    Orientation: 3C SiC (100)
    Surface: CMP (film chemical mechanical polished)
    Target doping level: 1.0E17 - 1.0E18 /cc
     (Available Doping range: 1E16 - 1E19 /cc)
    Type and dopant: N type, Nitrogen doping
  • Silicon substrate
  • Size: 100 mm dia x 0.525 mm thickness
    Orientation: (100)
    Type: N type / P doped (P type is available as well)
    Resistivity: 1- 10 ohm.cm (resistivities is dependent on the doping level)
    Polish: one side polished
  • Optional
  • We can provide dicing service per customer request
    Optional: you may need tool below to handle the wafer
     (click picture to order)