LaAlO3 single crystal provides a good lattice match to many materials with perovskite structure. It is an excellent substrate for epitaxial growth of high Tc superconductors, magnetic and ferro-electric thin films. The dielectric properties of LaAlO3 crystal are well suitable for low loss microwave and dielectric resonance applications.
Substrate Specifcations:
• Wafer Size: 20 x 20 x 0.5 mm thickness +/-0.05 mm,
• Wafer Orientation: (100) +/-0.5 Deg
• Polishing: One side CMP polished with free sub-surface damaged.
• Surface finish (RMS or Ra) : < 10A
• Package: Under 1000 class clean room, and in 100 grade plastic bag in a wafer container.
• Warning: LaAlO3 crystal has a visible twin on a polished surface, which is normal nature .
Typical Physical Properties
Crystal Structure
Rhombohedral at 25 oC:a=5.357 Angstroms c= 13.22 Angstroms Cubic at > 435 oC :a=3.821 Angstroms
Growth Method
Czochralski
Density
6.52 g/cm3
Melt Point
2080 oC
Thermal expansion
10 (x10-6/ oC)
Dielectric Constant
~ 25
Loss Tangent at 10 GHz
~3x10-4 @ 300K , ~0.6 x10-4 @77K
Color and Appearance
Transparent to Brown based on annealing condition.
Visible twins on polished substrate
Chemical Stability
Insoluble in mineral acids at 25 oC and soluble in H3PO3 at> 150 oC