Electrical Accessories

Portable 4 Probe Resistivity Tester for Electrodes and Crystal Substrate and - EQ-JX2008-LD

Portable 4 Probe Resistivity Tester for Electrodes and Crystal Substrate and - EQ-JX2008-LD

기본 정보
Product Name Portable 4 Probe Resistivity Tester for Electrodes and Crystal Substrate and - EQ-JX2008-LD
Sale Price Call for Price
Product Code EQ-JX2008-LD
Quantity 수량증가수량감소
상품 옵션
 

EQ-JX2008-LD resistivity tester is a portable and multi-functional 4 probes resistivity testing instrument, which is based on the principle of the four-point probe measurement. It can be used to measure the radial and axial resistivity of the sheet or block semiconductor materials and widely applied for the filtration in semiconductor and solar industry.


SPECIFICATIONS:

      Feature:

  •      •  Preset the sample thickness with the self-correcting function
  •      •  Measure the resistivity and show the value directly
  •      •  Test the P/N type of semiconductor accurately
  •      •  Set up the alarm threshold of the P/N type

    Specifications:

  •      •  Power Adaptor: Input: 100 - 240V AC, 50/60Hz, 0.8
  •      •  Output: +15V, 2.0 A
  •      •  Size: 155×120×50mm
  •      •  Testing Range: 0.001-100 ohm-cm
  •      •  Resistivity Testing Accuracy: ± 5%  ± 2LSB
  •      •  Minimum Testing Area: 10mm x 10mm
  •      •  If the testing sample is smaller, you may order High Conductive Silver Epoxy ( click picture below right to order )and lead wire to extend the four contact point
             as the below left picture.